Speaker Bio: Dr. Young M. Lee is technical leader and principal engineer for Artificial Intelligence at UL Solutions, where he leads AI safety initiatives, helps customers in developing and deploying safe AI products, and shapes the future of AI safety standards and certification services. Dr. Lee previously held the position of Distinguished Fellow and Director of AI at Johnson Controls for 6 years, where he led a global team of AI scientists in developing industrial AI solutions utilizing AI/ML and optimization technologies, including energy
prediction, energy optimization, fault detection, failure prediction, equipment control, and predictive maintenance applications. Prior to that, Dr. Lee dedicated 15 years to the IBM T.J. Watson Research Center as a Research Staff Member, Research Manager, and IBM Master Inventor. There, he was involved in the development of industrial applications that integrated AI/ML, mathematical modeling, optimization, and simulation. Earlier in his career, Dr. Lee spent over 10 years at BASF, a chemical company, where he established and led the Mathematical Modeling Group, driving the development of numerous AI, optimization, and simulation models for various manufacturing and supply chain processes. Dr. Lee is currently a technical advisory committee member of Pacific Northwest National Laboratory (PNNL)
providing technical advice in AI/ML, optimization model and simulation model to PNNL scientists for a U.S. Dept of Energy funded, multi-year project. He actively contributes to national and international AI standards development through participation in organizations such as ISO/IEC JTC 1/SC 42, IECEE, AIQI Consortium, and ANSI. Dr. Lee earned his B.S., M.S., and Ph.D. degrees from Columbia University. He has published six book chapters and over 80 refereed technical papers. As a prolific innovator, he is listed as the inventor on more than 100 patents.